High-Current Cantilever Style
Kelvin & Non-Kelvin
High Current/Power Test Contacting Solutions designed and validated for initial lab characterization through high-volume production test environments and applicable for leaded and leadless IC package styles.
High Current/Power devices in Analog, Digital, Mixed Signal, and Discrete, demand high performance test contacting solutions. JF Microtechnology offers high current/power test contacting solutions in Kelvin and non-Kelvin configurations to improve yields, up binning and reducing cost of test.

High mechanical life and quick maintenance cycles are also archived with replaceable individual contacts giving you reliable, repeatable, electrical and mechanical performance.
Alpha™ – Straight-Thru Contact Technology
(IC package and load board ends in vertical alignment)
Product available in Full-Kelvin, Dedicated/Selected-Kelvin, and Non-Kelvin configurations
Enables ability to maintain ±2⁰C from set point at DUT during test
Peak Current rated at 17.0A @ 1% Duty Cycle (300ms)
Continuous Current rated at [email protected] 100% Duty Cycle (300ms)
Inductance (self) rated at 3.54nH
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Gamma™ – X-Direction Off-Set Contact Technology
(IC package and load board ends are not in vertical alignment)
Product available in Full-Kelvin, Dedicated/Selected-Kelvin, and Non-Kelvin configurations
Enables ability to maintain ±2⁰C from set point at DUT during test
Peak Current rated at 30.0A @ 1% Duty Cycle (300ms)
Continuous Current rated at 4.0A @ 100% Duty Cycle (300ms)
Inductance (self) rated at 5.00nH
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About JF Technology


Since its establishment in 1999, JF Technology has become a global leader in the design and manufacturing of test probes and test sockets for the semiconductor industry. Learn more about our company.